Battery Tester
Benchtop Digital LCR Bridge and DCR Component Meter
Item Number : CD07
Price varies based on specs and customizations
- Measurement Bandwidth
- 10 Hz - 100 kHz (Continuous 1 Hz resolution)
- Basic Measurement Accuracy
- 0.20%
- Primary Parameter Measurement Range
- L: 0.001μH-9999H, C: 0.001pF-99.99mF, R/DCR: 0.0001Ω-99.99MΩ
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Product Overview


This high-precision benchtop digital LCR bridge instrument is engineered on an advanced auto-balancing bridge architecture, providing uncompromising impedance and parameter characterization across passive components, active materials, and electrochemical systems. Operating across bandwidths up to 100 kHz with continuous 1 Hz frequency resolution, the system delivers 0.2% basic measurement accuracy. By integrating dedicated direct current resistance (DCR) analysis alongside electrolytic capacitor characterization modes, this equipment establishes an essential testing baseline for rigorous analytical laboratories and high-throughput electronic manufacturing environments.
Engineered to streamline both component evaluation and automated quality workflows, the instrument features built-in multi-level sorting comparators, programmable bias voltage generation, and versatile test signal levels. It serves critical functions across battery research laboratories, electronic component fabrication lines, incoming quality control (IQC) stations, and precision sensor manufacturing facilities. High sampling speed capabilities paired with flexible trigger controls ensure that the bridge transitions effortlessly from manual benchtop diagnostics to fully automated handler-driven inspection stations.
Built with industrial-grade electromagnetic shielding, robust front-end analog signal conditioning, and comprehensive open/short fixture compensation, this test instrument maintains superior data stability and repeatability under demanding production shifts. Its vivid 3.5-inch TFT color display, dual 5-digit parameter readouts, and standard SCPI-compliant communication interfaces provide researchers and test engineers with maximum measurement confidence, complete trace documentation, and rapid system integration.
Key Features
- Auto-Balancing Bridge Architecture: Implements four-terminal Kelvin measurement topology with an advanced auto-balancing bridge circuit, effectively eliminating lead impedance and contact resistance to ensure a 0.2% basic measurement accuracy across wide dynamic ranges.
- Continuous Frequency and Level Control: Provides test frequency capabilities up to 100 kHz with continuous 1 Hz fine-step tuning, combined with an adjustable AC excitation signal level from 10 mV to 2000 mV in 1 mV increments for true component profiling under exact operating conditions.
- Integrated DCR and Electrolytic Testing: Features native Direct Current Resistance (DCR) mode and dedicated electrolytic capacitor measurement algorithms, enabling comprehensive passive component characterization without requiring external signal sources or secondary meters.
- Adjustable Internal DC Bias Source: Includes an integrated programmable DC bias output from 10 mV to 1500 mV (with 1 mV resolution), facilitating accurate capacitance voltage-coefficient analysis, semiconductor junction evaluation, and polarized dielectric testing.
- Advanced 5-Bin Comparator and Sorting: Features hardware-driven 5-bin sorting (three pass bins, one fail bin, and one auxiliary bin) with acoustic alarms and screening tolerance limits adjustable from -50% to +50%, maximizing sorting efficiency on production lines.
- High-Speed Measurement Engine: Offers selectable acquisition rates of 2 readings/second (Slow), 4 readings/second (Medium), and 8 readings/second (Fast), allowing operators to optimize the exact balance between rapid manufacturing throughput and ultra-low-noise analytical precision.
- Comprehensive Fixture Calibration: Supports full-range open-circuit and short-circuit calibration routines, zeroing out stray capacitance, parasitic inductance, and fixture lead resistance to maintain laboratory-grade measurement integrity.
- Intuitive Display and Statistical Logging: Houses a 3.5-inch 16M-color TFT screen with simultaneous 5-digit main and secondary parameter visualization, real-time statistical logging (maximum, minimum, average), and switchable bilingual system firmware.
- Extensive Industrial Connectivity: Equipped with standard USB Device, RS-232 (or RS-485), and Handler interfaces supporting industry-standard SCPI command syntax, with optional expansion to GPIB and USB Host for automated test equipment (ATE) integration.
Applications
| Application | Description | Key Benefit |
|---|---|---|
| Battery Electrode & Contact Testing | Characterizes contact resistance, current collector foil impedance, and direct current resistance (DCR) on battery tabs and cell assemblies. | Ensures low internal resistance and superior conductivity across energy storage materials to prevent thermal runaway. |
| Passive Component Manufacturing | High-speed sorting and verification of surface-mount inductors, precision thin-film resistors, and multi-layer ceramic capacitors (MLCC). | Delivers rapid 5-bin qualification via automated handler interfaces, significantly reducing inspection cycle times. |
| Electrolytic Capacitor Verification | Evaluates equivalent series resistance (ESR), loss factor (tan δ / D), and polarized capacitance under internal DC bias voltages. | Prevents defective dielectric components from entering power electronic assemblies, enhancing field reliability. |
| Magnetic Material Characterization | Measures core loss, inductance (L), and quality factor (Q) on ferrite cores, chokes, and high-frequency pulse transformers across swept frequencies. | Identifies optimal magnetic saturation and high-frequency response boundaries for switch-mode power designs. |
| Incoming Quality Control (IQC) | Rapid parameter screening and tolerance validation (-50% to +50%) for incoming passive electronic components against vendor specifications. | Intercepts out-of-spec batches before board assembly, eliminating downstream manufacturing rework and costs. |
| Piezoelectric & Ceramic Sensor R&D | Profiles impedance (Z), phase angle (θ), and reactance (X) over continuous frequency bands to pinpoint fundamental resonance points. | Provides fine 1 Hz resolution and 0.2% precision necessary for mapping acoustic transducers and functional ceramics. |
| Semiconductor Package Testing | Evaluates lead-frame resistance, parasitic packaging inductance, and pin-to-pin leakage under controlled AC drive levels. | Minimizes high-frequency parasitic signal distortion in advanced semiconductor packaging architectures. |
Technical Specifications
| Specification Parameter | Fixed Frequency Series (CD07-4401 / CD07-4402 / CD07-4410) | Continuous Frequency Series (CD07-4501 / CD07-4502 / CD07-4510) |
|---|---|---|
| Base Model Identifiers | CD07-4401: 10 Fixed Points (100 Hz – 10 kHz) CD07-4402: 12 Fixed Points (100 Hz – 20 kHz) CD07-4410: 16 Fixed Points (100 Hz – 100 kHz) |
CD07-4501: 10 Hz – 10 kHz (Continuous, 1 Hz step) CD07-4502: 10 Hz – 20 kHz (Continuous, 1 Hz step) CD07-4510: 10 Hz – 100 kHz (Continuous, 1 Hz step) |
| Basic Measurement Accuracy | 0.20% | 0.20% |
| Display Type & Resolution | 3.5-inch TFT LCD, 480 × 320 resolution, 16M colors | 3.5-inch TFT LCD, 480 × 320 resolution, 16M colors |
| Display Digits | Primary Parameter: 5 digits; Secondary Parameter: 5 digits | Primary Parameter: 5 digits; Secondary Parameter: 5 digits |
| Primary Parameters | L (Inductance), C (Capacitance), R (Resistance), Z (Impedance) | L (Inductance), C (Capacitance), R (Resistance), Z (Impedance) |
| Secondary Parameters | X (Reactance), D (Dissipation Factor), Q (Quality Factor), θ (Phase Angle), ESR (Equivalent Series Resistance) | X (Reactance), D (Dissipation Factor), Q (Quality Factor), θ (Phase Angle), ESR (Equivalent Series Resistance) |
| Inductance Measurement Range (L) | 0.001 μH – 9999 H | 0.001 μH – 9999 H |
| Capacitance Measurement Range (C) | 0.001 pF – 99.99 mF | 0.001 pF – 99.99 mF |
| Resistance Measurement Range (R / DCR) | 0.0001 Ω – 99.99 MΩ | 0.0001 Ω – 99.99 MΩ |
| Measurement Speed | Slow: 2 times/s; Medium: 4 times/s; Fast: 8 times/s | Slow: 2 times/s; Medium: 4 times/s; Fast: 8 times/s |
| Test Signal Excitation Level | 6 Fixed Levels: 0.1 V, 0.3 V, 0.6 V, 1.0 V, 1.5 V, 2.0 V | 0.1 V – 2.0 V continuously adjustable, 1 mV steps |
| Signal Source Output Impedance | Selectable 300 Ω, 1000 Ω | Selectable 300 Ω, 1000 Ω |
| Internal DC Bias Source | 0 mV – 1500 mV adjustable, 1 mV steps | 0 mV – 1500 mV adjustable, 1 mV steps |
| Range Selection Mode | Auto Range and Manual Range locking | Auto Range and Manual Range locking |
| Calibration Functionality | Full-scale Open Circuit and Short Circuit zero-clearing | Full-scale Open Circuit and Short Circuit zero-clearing |
| Screening & Tolerance Setup | Limit range: -50% to +50%; Fixed standard points: 1%, 5%, 10%, 20% | Limit range: -50% to +50%; Fixed standard points: 1%, 5%, 10%, 20% |
| Comparator Binning | 5 Bins: 3 Qualified (Pass) Bins, 1 Unqualified (Fail) Bin, 1 Auxiliary Bin with beeper alarm | 5 Bins: 3 Qualified (Pass) Bins, 1 Unqualified (Fail) Bin, 1 Auxiliary Bin with beeper alarm |
| Data Logging & Statistics | Maximum, Minimum, Average value recording | Maximum, Minimum, Average value recording |
| Command Set & Protocol | Standard SCPI protocol | Standard SCPI protocol |
| Standard Communication Interfaces | RS-232 (or RS-485), USB Device, Handler | RS-232 (or RS-485), USB Device, Handler |
| Optional Communication Interfaces | GPIB (IEEE-488), USB Host | GPIB (IEEE-488), USB Host |
| Power Supply Requirements | 220 V AC ±10% or 110 V AC ±10%, 45 Hz – 65 Hz | 220 V AC ±10% or 110 V AC ±10%, 45 Hz – 65 Hz |
| Power Consumption | < 10 W | < 10 W |
| Operating Environment | Temperature: 10°C to +40°C; Humidity: ≤ 90% RH (at 0°C to 40°C) | Temperature: 10°C to +40°C; Humidity: ≤ 90% RH (at 0°C to 40°C) |
| Storage Environment | Temperature: -10°C to +60°C | Temperature: -10°C to +60°C |
| Included Standard Accessories | 3-Core Power Cable (30A51), 4-Terminal Kelvin Test Cable (35A51), User Manual | 3-Core Power Cable (30A51), 4-Terminal Kelvin Test Cable (35A51), User Manual |
| Optional Test Fixtures & Cables | GPIB Cable (32P01), RS-232 Serial Cable (32P04), USB Data Cable (32P05), 2m/4m Extended Test Cable (35P01), Lead-Type Kelvin Test Fixture (35A52), SMD Patch Component Fixture (35P02), 4-Wire LCR SMD Tweezers/Pen (35P03), 4-Terminal Pair Kelvin Fixture, Gold-Plated Shorting Plate (35A53) | GPIB Cable (32P01), RS-232 Serial Cable (32P04), USB Data Cable (32P05), 2m/4m Extended Test Cable (35P01), Lead-Type Kelvin Test Fixture (35A52), SMD Patch Component Fixture (35P02), 4-Wire LCR SMD Tweezers/Pen (35P03), 4-Terminal Pair Kelvin Fixture, Gold-Plated Shorting Plate (35A53) |
Why Choose This Product
- Exceptional Metrological Integrity: Built around a precision auto-balancing analog front end with 0.2% base accuracy, this instrument guarantees stable, drift-free impedance measurements essential for both scientific publications and industrial compliance.
- Dual-Purpose Versatility for DCR and AC Impedance: By incorporating high-resolution direct current resistance (down to 0.0001 Ω) and AC impedance analysis up to 100 kHz in one compact unit, this equipment consolidates your test bench and lowers capital investment.
- Seamless Automated Manufacturing Integration: Featuring standard Handler, RS-232/485, and USB interfaces paired with robust SCPI command parsing, this system easily integrates into high-speed sorting machines, robotic pick-and-place lines, and centralized factory execution systems.
- Comprehensive Fixture and Accessory Ecosystem: From 4-terminal Kelvin test leads to SMD patch component tweezers and gold-plated calibration plates, our complete accessory suite eliminates parasitic errors across any component geometry.
Contact our technical engineering team today to receive a personalized quote, request a customized test fixture configuration, or discuss how this benchtop digital bridge can optimize your testing workflows.
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Product Datasheet
Benchtop Digital LCR Bridge and DCR Component Meter
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