Precision LCR Digital Bridge Meter 10 Hz to 1 MHz Component Impedance Analyzer

Product Overview

This precision digital LCR bridge meter is an advanced electronic component and material parameter analyzer designed on the auto-balancing bridge principle. Featuring a continuously adjustable test frequency spectrum spanning from 10 Hz to 1 MHz, a baseline measurement accuracy of 0.05%, and a 6.5-digit display resolution, this system delivers metrology-grade impedance characterization. Its architecture integrates automatic level control (ALC), multi-frequency list sweeping, and automated binning to ensure complete, repeatable, and high-resolution data acquisition across all fundamental passive parameters.

Engineered for high-demand environments, the instrument serves as a core analytical tool in advanced materials research, dielectric property profiling, battery electrode impedance studies, and semiconductor component validation. It is equally proficient on automated production lines and incoming quality control (IQC) stations, where high throughput and dependable classification are paramount. The system bridges the gap between laboratory-grade precision analytical capability and high-speed industrial manufacturing demands.

Built with premium industrial-grade solid-state circuitry, switchable signal source impedances (30 Ω and 100 Ω), and comprehensive open/short/load calibration routines with 256-point frequency correction, this unit maintains superior measurement stability. Even in environments subject to electromagnetic noise and operational thermal drift, the equipment provides stable, reproducible results, making it an essential asset for engineering labs and quality assurance departments.

Key Features

• Auto-Balancing Bridge Core Architecture: Delivers exceptional 0.05% basic accuracy and 6.5-digit measurement resolution across an extensive dynamic impedance spectrum, guaranteeing exact data fidelity for research and production.
• Continuous Broadband Frequency Range: Offers continuous frequency coverage from 10 Hz up to 1 MHz with 1 mHz resolution and 0.01% frequency accuracy, enabling fine-step resonance tracking and frequency-dependent component modeling.
• High-Throughput Acquisition Engine: Achieves measurement acquisition rates of up to 200 measurements per second (at test frequencies ≥1 kHz) and a 20 ms fast cycle (at ≥100 Hz), facilitating seamless integration into high-speed automated sorting systems.
• Comprehensive Multi-Parameter Characterization: Simultaneously evaluates 20 distinct parameter combinations including inductance (Lp, Ls), capacitance (Cp, Cs), resistance (Rp, Rs), impedance (|Z|, Xs), admittance (|Y|, G, B), phase angles (θr, θd), dissipation factor (D), and quality factor (Q).
• Integrated Dual DC Bias Capabilities: Features an internal programmable DC bias source supplying -2V to +2V voltage bias and -20mA to +20mA current bias, alongside support for external DC bias inputs up to ±60V for active semiconductor and polarized dielectric testing.
• Dynamic Automatic Level Control (ALC): Actively regulates and stabilizes excitation signal voltages (0 to 2 Vrms) and currents (100 μArms to 20 mArms), preventing device-under-test (DUT) overload and maintaining constant drive levels.
• 10-Point Multi-Frequency List Sweep: Executes automated sequential testing across 10 user-defined frequency, voltage, or current steps to quickly capture dynamic response curves and frequency dispersion properties.
• 10-Bin Sorting and Statistical Comparator: Features a built-in multi-channel comparator with 8 pass bins, 1 fail bin, and 1 auxiliary bin coupled with real-time counting to streamline quality grading and component binning.
• Vivid 7-Inch Dual-Language Interface: Equipped with an 800×480 TFT LCD supporting both English and Chinese operating menus, offering clear parameter readouts, bar graphs, and intuitive operational control.
• Complete Industrial Communication Array: Standardized with GPIB, Ethernet LAN, RS232C, USB Host, USB Device, and opto-isolated Handler interfaces to allow remote automation and full SCADA/PLC integration.

Applications

Technical Specifications

Why Choose This Product

• Precision Metrology Engineering: Designed with an auto-balancing bridge core that delivers 0.05% basic measurement accuracy and 6.5 digits of resolution, providing absolute confidence in research-grade and commercial data.
• Complete Frequency Scalability: Available in flexible bandwidth options from 100 kHz up to 1 MHz with 1 mHz resolution, allowing organizations to select the precise frequency span tailored to their laboratory budget and application requirements.
• Automated Manufacturing Ready: With acquisition speeds reaching 200 readings per second, 10-bin hardware sorting, and standard Handler/GPIB connectivity, this system integrates effortlessly into high-volume component test stations.
• Comprehensive DC Bias & ALC Control: Integrated internal bias, external 60V bias capability, and dynamic level leveling ensure stable testing of sensitive semiconductors, capacitors, and inductive components under realistic operating stresses.
• Reliable Long-Term Support: Backed by KINTEK's technical expertise in materials testing and laboratory instrumentation, ensuring responsive application guidance, calibration support, and long-term hardware reliability.

Contact our technical engineering team today to discuss your testing requirements, request a detailed quotation, or explore custom fixture solutions for your laboratory.

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